尤物视频

Synopsis

The deliberate implantation of materials using focused ion beams (FIB) is a powerful and versatile approach to engineering materials at the nanoscale. This technology enables precise doping of materials, allowing for the tailored modification of optical and electronic properties. By selecting appropriate ion species, energies, and target materials, FIB offers control over critical parameters such as band structure, carrier concentration, and optical behavior in semiconductors, 2D materials, and advanced functional systems. In addition to doping, ion-bombardment-induced self-assembly is an emerging capability of FIB, enabling the spontaneous formation of nanoscale features like quantum dots, nanowires, or periodic patterns, adding new dimensions to material design for photonics, electronics, and quantum technologies.

Characterizing these ion-modified materials is essential for understanding and optimizing their performance. Advanced techniques such as transmission electron microscopy (TEM) provide high-resolution imaging and structural insights into ion-induced defects, phase transformations, and lattice integrity. Atom probe tomography (APT) offers 3D atomic-scale compositional mapping, precisely quantifying the distribution of implanted dopants. Complementing these, the introduction of focused ion beam-secondary ion mass spectrometry (FIB-SIMS) adds a critical capability to the characterization toolkit, enabling highly sensitive and localized chemical analysis. FIB-SIMS allows for direct detection of dopants and impurities with excellent spatial resolution, bridging the gap between structural analysis and chemical quantification.

This seminar will explore the multifaceted capabilities of FIB in material engineering, highlighting applications such as controlled doping, ion-bombardment-induced self-assembly, and advanced characterization. We will discuss how the integration of FIB-SIMS with TEM and APT enhances our ability to correlate structural, compositional, and chemical changes at the nanoscale. Through case studies, we will demonstrate how these technologies collectively drive breakthroughs in material science, enabling the development of next-generation devices for electronics, photonics, and quantum applications.

Biography

Dr. Nabil Bassim is a Professor in the Department of Materials Science and Engineering at McMaster University and serves as the Scientific Director of the Canadian Centre for Electron Microscopy (CCEM). He earned his Ph.D. in Materials Science and Engineering from the University of Florida. Before joining McMaster, Dr. Bassim was a Materials Research Engineer at the U.S. Naval Research Laboratory.

Dr. Bassim's research focuses on advancing electron and ion microscopy techniques to explore and manipulate materials at the nanoscale. His work encompasses a diverse range of materials, including structural materials like concrete and steel, as well as nanomaterials and two-dimensional materials. He has contributed significantly to the understanding of beam-sample interactions and the use of focused ion beam microscopy in many materials applications.

In addition to his research, Dr. Bassim is committed to education, teaching courses on materials characterization by electron and ion microscopy. He is also the co-founder and co-organizer of the FIB-SEM User Meeting, the largest focused ion beam conference in North America.